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Texas Instruments SN74BCT8374ANT
IC SCAN TEST DEVICE W/FF 24-DIP
Manufacturer # :SN74BCT8374ANT
Manufacturer :Texas Instruments
Dasenic # :04E6B7-DS
Datasheet :
SN74BCT8374ANT Datasheet
SN74BCT8374ANT DatasheetSample :
Customer # :
Description : IC SCAN TEST DEVICE W/FF 24-DIP 24-DIP (0.300", 7.62mm) Tube
Pricing (USD) : *To apply for a price, please click the Send Target Price button
| Quantity | Unit Price | Total |
| 68+ | $ 4.023000 | $ 273.56 |
In Stock: 4950
MOQ :1 PCS
Packaging :24-DIP (0.300", 7.62mm) Tube
Delivery Time :Ship Within 48 Hours
Shipping Origin :Shenzhen or Hong Kong Warehouse
Quantity :
Unit Price : $ 4.023
Total :$ 4.02
Delivery : 
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- Category:Integrated Circuits (ICs)/Specialty Logic
- Product Status:Obsolete
- Operating Temperature:0°C ~ 70°C
- Mounting Type:Through Hole
- Package / Case:24-DIP (0.300", 7.62mm)
- Supplier Device Package:24-PDIP
- Supply Voltage:4.5V ~ 5.5V
- Number of Bits:8
- Logic Type:Scan Test Device with D-Type Edge-Triggered Flip-Flops
- Series:74BCT
- Base Product Number:74BCT8374
- Packaging:Tube
